A RF Test Stand Control System for The XFEL/SPring-8
A.Yamashita, M.Yamaga, S.Takahashi, T.Masuda, T.Ohata (JASRI/SPring-8) H.Maesaka, K.Shirasawa, N.Hosoda, T.Fukui*, T.Hasegawa, T.Ohshima, Y.Otake (RIKEN/SPring-8)
The X-ray free electron laser (XFEL) facility is under construction at SPring-8. An rf test stand was build for the XFEL to assure performance of the delivered rf components under the high-power condition and to establish a conditioning procedure for stable operation with design rf power. In addition, the test stand is used to confirm a performance of a low-level rf system, a precise water temperature control system, a vacuum system and an rf high power system. In this paper we describe a software framework to control those equipment and test results of a newly developed software component include device drivers with Solaris 10 for x86.